Test and Diagnosis of Analogue， Mixed-Signal and RF Integrated Circuits： the system on chip approach（Y. Sun， Yichuang Sun）（IET 2007）
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    Test and Diagnosis of Analogue， Mixed-Signal and RF Integrated Circuits： the system on chip approach（Y. Sun， Yichuang Sun）（IET 2007）

内容简介

书名：Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach
出版社：IET
作者：Y. Sun, Yichuang Sun
出版年份：2007
电子书格式： pdf
简介：This book, “Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits”, provides a comprehensive guide to testing and diagnosing analog, mixed-signal, and RF integrated circuits, focusing on the system-on-chip approach. It delves into critical methodologies for effective circuit testing, offering readers a deep understanding of the principles and practical applications. Ideal for researchers, engineers, and students in the field of integrated circuit design, the book’s in-depth coverage and system-on-chip perspective are invaluable for advancements in the field. Discover advanced techniques for efficient testing.
ISBN：9780863417450, 08634

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